Scanning Ion Conductance Microscopy for Studying Biological Samples

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Scanning Ion Conductance Microscopy for Studying Biological Samples

Scanning ion conductance microscopy (SICM) is a scanning probe technique that utilizes the increase in access resistance that occurs if an electrolyte filled glass micro-pipette is approached towards a poorly conducting surface. Since an increase in resistance can be monitored before the physical contact between scanning probe tip and sample, this technique is particularly useful to investigate...

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Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte ­solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...

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Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte ­solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...

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Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte ­solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...

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ژورنال

عنوان ژورنال: Sensors

سال: 2012

ISSN: 1424-8220

DOI: 10.3390/s121114983